The Agilent E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. It will provide innovations in R&D of components and circuit designers who evaluate components in the range of 3 GHz. The Agilent E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.

Material Evaluation
The Agilent E4991A provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz).

On-Wafer Measurement
The E4991A-010, Probe Station Connection Kit, enables us to easily connect the Agilent E4991A to a RF probe system from Cascade Microtech for making on-wafer impedance measurements.

Temperature Characteristic Evaluation
The temperature characteristic test kit, the E4991A-007, is a new solution of temperature characteristic measurement for components and materials. This option provides highly accurate temperature characteristic analysis capability within the wide temperature range from - 55°C to + 150°C with a powerful temperature drift compensation function.


Features

     * Basic accuracy +/-0.8%
     * 3GHz impedance direct read-out
     * Windows-styled user interface
     * Sweep parameters (frequency, ac level, dc bias)
     * Built-in VBA programming function
     * Various test fixture for components
     * Data transfer through the LAN interface
     * Direct read-out permittivity, permeability [option]
     * Reliable on-wafer measurement [option]
     * Temperature characteristic measurement [option]